繁體中文
ENGLISH
Thin Film Thickness Measurement System
- Laser
- Laser Measuring System
-
Optical Testing Equipment
- Micro Spectrometer
- Thin Film Thickness Measurement System
- UV/VIS/IR Photo Detector
- Spectrographs
- Monochromators
- Vacuum Dewar
- Center Thickness Measurement System
- MTF Test System
- Laser Alignment & Assembly Station
- Spectroradiometer
- Spectral Irradiance Meter
- Blackbody
- IRCOL Test System
- THz Detectors
- THz Generators
- Photochemical Reactor
- Quantum technology teaching experiment system
- Optical Thin Film Design and Analysis Software
-
Material Analysis Systems
- Ferroelectric Thin Film Analyzer
- aixDBLI Double Beam Laser Interferometer
- aixCMA Ceramic Multilayer Actuator Test Bench
- aixPES Piezoelectric Evaluation System
- aix4PB Piezoelectric thin film characterization system for MEMS
- AFM
- High Voltage Pulse Generators
- StrainScope
- Solar Simulator
- Quantum Efficiency Measurement System
- Semiconductor Process System
- Precise Optical Institution
- Optical Lens & Accessory